IEC 61000-4-4:1995
Collections
International IEC standards
Publication date
January 1995
Number of pages
59 p.
Reference
IEC 61000-4-4:1995
Print number
1
IEC 61000-4-4:1995
January 1995
International standard
Cancelled
Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test. Basic EMC Publication
Relates to the immunity requirements and test methods forelectrical and electronic equipment to repetitive electrical fasttransients. Additionally defines ranges of test levels andestablishes test procedures. The object of this standard is to establish a common andreproducible basis for evaluating the performance of electrical andelectronic equipment when subjected to repetitive fast transients(bursts), on supply, signal and control ports. The test is intended to demonstrate the immunity of electrical andelectronic equipment when subjected to types of transientdisturbances such as those originating from switching transients(interruption of inductive loads, relay contact bounce, etc.). Thestandard defines:- test voltage waveform;- range of test levels;- test equipment;- test set-up;- test procedure.
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Sumary
Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test. Basic EMC Publication
Relates to the immunity requirements and test methods for electrical and electronic equipment to repetitive electrical fast transients. Additionally defines ranges of test levels and establishes test procedures. The object of this standard is to establish a common and reproducible basis for evaluating the performance of electrical and electronic equipment when subjected to repetitive fast transients (bursts), on supply, signal and control ports. The test is intended to demonstrate the immunity of electrical and electronic equipment when subjected to types of transient disturbances such as those originating from switching transients (interruption of inductive loads, relay contact bounce, etc.). The standard defines: - test voltage waveform; - range of test levels; - test equipment; - test set-up; - test procedure.
Relates to the immunity requirements and test methods for electrical and electronic equipment to repetitive electrical fast transients. Additionally defines ranges of test levels and establishes test procedures. The object of this standard is to establish a common and reproducible basis for evaluating the performance of electrical and electronic equipment when subjected to repetitive fast transients (bursts), on supply, signal and control ports. The test is intended to demonstrate the immunity of electrical and electronic equipment when subjected to types of transient disturbances such as those originating from switching transients (interruption of inductive loads, relay contact bounce, etc.). The standard defines: - test voltage waveform; - range of test levels; - test equipment; - test set-up; - test procedure.
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Replaced standards
(1)
IEC 60801-4:1988
January 1988
International standard
Cancelled
Electromagnetic compatibility for industrial-process measurement and control equipment - Part 4: Electrical fast transient/burst requirements
Standard replaced by
(1)
IEC 61000-4-4:2004
July 2004
International standard
Cancelled
Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
Establishes a common and reproducible reference for evaluating the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this part of IEC 61000-4 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. The standard defines: - test voltage waveform; - range of test levels; - test equipment; - verification procedures of test equipment; - test set-up; - test procedure. The standard gives specifications for laboratory and post-installation tests. The contents of the corrigenda of August 2006 and June 2007 have been included in this copy.
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