IEC 61010-031:2015+AMD1:2018 CSV/COR1:2018

Deals with the safety of hand-held and hand-manipulated probe assemblies. They are for use in the interface between an electrical phenomenon and test or measurement equipment. Three main types are described: (A) Low-voltage and high-voltage, non-attenuating probe assemblies. For voltages less lthan 63 kV. They do not incorporate active components. (B) High-voltage attenuating or divider probe assemblies. For voltages less than 63 kV. They incorporate a divider function. (C) Low voltage attenuating or divider probe assemblies. For voltages less than 1 kV r.m.s or 1,5 kV d.c. They incorporate a signal conditioning function. It has the status of a group safety publication in accordance with IEC Guide 104.

IEC 61010-031:2022 specifies safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement, and their related accessories. These probe assemblies are for non-contact or direct electrical connection between a part and electrical test and measurement equipment. They can be fixed to the equipment or be detachable accessories for the equipment. It has the status of a group safety publication in accordance with IEC Guide 104. This third edition cancels and replaces the second edition published in 2015, and Amendment 1:2018. IEC 61010-031 is a stand-alone standard. This edition includes the following significant technical changes with respect to the previous edition: the scope has been made succinct. General information from the scope of Edition 2 has been moved to a new Clause 4. Consequently, Clause 4 to Clause 8 of Edition 2 have been renumbered. Clause 9 of Edition 2 has been deleted; in Clause 2, normative references have been dated and new normative references have been added; in 3.1.4, the definition of probe tip has been modified; in 4.1, there is no longer any differentiation between high voltage and low voltage probe assemblies. Type C probe assemblies have been merged with Type B probe assemblies; in 4.1 d) "Kelvin" probes have been added to the list of probe assemblies as a new Type E and a new Figure 5; in 4.1 e), probes for voltage measurement without electrical connection to conductors have been added to the list of probe assemblies as a new Type F and a new Figure 6; in 4.2.1, spread of fire is no longer considered as a hazard; Subclause 4.4.2.5 from Edition 2 has been deleted; Subclause 4.4.4.3 from Edition 2 has been deleted; in 5.4.4.1 consideration has been given to spacings and impedance; in 6.1.1, removable parts of probe tips which bear markings are allowed; in 6.1.5, the voltage to be marked for measurement categories is the AC line-to-neutral or DC voltage; in 7.4.2, requirements for unmated connectors have been modified as follows: Table 2 has been modified and expanded, a calculation method for clearances of connectors above 20 kV has been defined, creepage distances have been aligned with clearances; in 7.4.3.1 and 7.4.3.5, requirements for IP2X probe tips with retractable sleeve have been added; in 7.4.3.2, Probe tips are now applicable to non-contact probe assemblies; in 7.5.2.3.2, the values of Table 5 have been modified; in 7.6.2, voltage tests of clearances are done without humidity preconditioning; pre-treatments for rigidity test from Clause 10 of Edition 2 have been moved to 9.2; Subclause 11.1 of Edition 2 has been deleted; addition of an exception for Type E probe assembly in 13.2. Removable parts of probe tips which bear markings are allowed; Figure F.1 has been modified; Annex G has been added, for determination of clearances for Table 2; Annex H has been added, covering line-to-neutral voltages for common mains supply systems.