IEC 61094-8:2012

IEC 61094-8:2012

September 2012
International standard Current

Measurement microphones - Part 8: Methods for determining the free-field sensitivity of working standard microphones by comparison

IEC 61094-8:2012 applicable to working standard microphones meeting the requirements of IEC 61094-4. It describes methods of determining the free-field sensitivity by comparison with a laboratory standard microphone or working standard microphone (where applicable) that has been calibrated according to either; IEC 61094-3; IEC 61094-2; IEC 61094-5; IEC 61094-6; or this part of IEC 61094. Methods performed in an acoustical environment that is a good approximation to an ideal free-field (e.g. a high quality free-field chamber), and methods that use post processing of results to minimise the effect of imperfections in the acoustical environment, to simulate free-field conditions, are both covered by this part of IEC 61094. Comparison methods based on the principles described in IEC 61094-3 are also possible but beyond the scope of this part of IEC 61094.

Main informations

Collections

International IEC standards

Publication date

September 2012

Number of pages

61 p.

Reference

IEC 61094-8:2012

ICS Codes

17.140.50   Electroacoustics
Sumary
Measurement microphones - Part 8: Methods for determining the free-field sensitivity of working standard microphones by comparison

IEC 61094-8:2012 applicable to working standard microphones meeting the requirements of IEC 61094-4. It describes methods of determining the free-field sensitivity by comparison with a laboratory standard microphone or working standard microphone (where applicable) that has been calibrated according to either; IEC 61094-3; IEC 61094-2; IEC 61094-5; IEC 61094-6; or this part of IEC 61094. Methods performed in an acoustical environment that is a good approximation to an ideal free-field (e.g. a high quality free-field chamber), and methods that use post processing of results to minimise the effect of imperfections in the acoustical environment, to simulate free-field conditions, are both covered by this part of IEC 61094. Comparison methods based on the principles described in IEC 61094-3 are also possible but beyond the scope of this part of IEC 61094.
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