IEC 61163-1:1995

IEC 61163-1:1995

August 1995
International standard Cancelled

Reliability stress screening - Part 1: Repairable items manufactured in lots

These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.

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Main informations

Collections

International IEC standards

Publication date

August 1995

Number of pages

153 p.

Reference

IEC 61163-1:1995

Print number

1
Sumary
Reliability stress screening - Part 1: Repairable items manufactured in lots

These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.
Standard replaced by (1)
IEC 61163-1:2006
June 2006
International standard Current
Reliability stress screening - Part 1: Repairable assemblies manufactured in lots

This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.

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