IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:- addition of two statistical models for reliability growth planning and tracking in the product design phase;- statistical methods for the reliability growth programme in the design phase of IEC 61014;- addition of the discrete reliability growth model for the test phase;- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;- addition of real lif examples for most of the statistical models;- numerical correction of tables in the reliability growth test example.This publication is to be read in conjunction with IEC 61014:2003.
This standard gives models and numerical methods for reliability growth assessments based on failure data from a single system which were generated in a reliability improvement programme.
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