IEC 61340-3-2:2006
Collections
International IEC standards
Publication date
December 2006
Number of pages
19 p.
Reference
IEC 61340-3-2:2006
IEC 61340-3-2:2006
December 2006
International standard
Cancelled
Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
Describes the discharge current waveforms used to simulate machine model (MM) electrostatic discharges (ESD) and the basic requirements for equipment used to develop and verify these waveforms. This standard covers MM ESD waveforms for use in general test methods and for application to materials or objects, electronic components and other items for ESD withstand test or performance evaluation purposes. The specific application of these MM ESD waveforms to non-powered semiconductor devices is covered in IEC 60749-27. The major change of this document is that it no longer contains the application to semiconductor devices.
Main informations
See more
See less
Sumary
Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
Describes the discharge current waveforms used to simulate machine model (MM) electrostatic discharges (ESD) and the basic requirements for equipment used to develop and verify these waveforms. This standard covers MM ESD waveforms for use in general test methods and for application to materials or objects, electronic components and other items for ESD withstand test or performance evaluation purposes. The specific application of these MM ESD waveforms to non-powered semiconductor devices is covered in IEC 60749-27. The major change of this document is that it no longer contains the application to semiconductor devices.
Describes the discharge current waveforms used to simulate machine model (MM) electrostatic discharges (ESD) and the basic requirements for equipment used to develop and verify these waveforms. This standard covers MM ESD waveforms for use in general test methods and for application to materials or objects, electronic components and other items for ESD withstand test or performance evaluation purposes. The specific application of these MM ESD waveforms to non-powered semiconductor devices is covered in IEC 60749-27. The major change of this document is that it no longer contains the application to semiconductor devices.
See more
Voir moins
Replaced standards
(1)
IEC 61340-3-2:2002
March 2002
International standard
Cancelled
Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) - Component testing
Describes the discharge current waveforms used to define the MM and the basic equipment requirements used to develop these waveforms. Test parameters are defined for testing and classifying the electrostatic discharge (ESD) sensitivity of non-powered devices to the MM. The purpose of this standard is to establish a test model that will replicate MM failures and will define the MM transient current discharge waveform and all necessary test parameters to ensure reliable, reproducible test results. Reproducible data will allow accurate comparisons of MM ESD sensitivity levels.
Need to identify, monitor and decipher standards?
COBAZ is the simple and effective solution to meet the normative needs related to your activity, in France and abroad.
Available by subscription, CObaz is THE modular solution to compose according to your needs today and tomorrow. Quickly discover CObaz!
Request your free, no-obligation live demo
I discover COBAZ