IEC 61580-9:1996

IEC 61580-9:1996

July 1996
International standard Current

Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.

Main informations

Collections

International IEC standards

Publication date

July 1996

Number of pages

15 p.

Reference

IEC 61580-9:1996

Print number

1 - 13/06/2005
Sumary
Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.
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