IEC 61587-1:1999
IEC 61587-1:1999

IEC 61587-1:1999

June 1999
International standard Cancelled

Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 - Part 1: Climatic, mechanical tests and safety aspects for cabinets, racks, subracks and chassis

Specifies mechanical tests, climatic tests and safety aspects for cabinets, racks, subracks and chassis as defined in the detail standards of IEC 60917 and IEC 60297 for indoor and outdoor applications.

Main informations

Collections

International IEC standards

Publication date

June 1999

Number of pages

41 p.

Reference

IEC 61587-1:1999

ICS Codes

31.240   Mechanical structures for electronic equipment

Print number

1
Sumary
Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 - Part 1: Climatic, mechanical tests and safety aspects for cabinets, racks, subracks and chassis

Specifies mechanical tests, climatic tests and safety aspects for cabinets, racks, subracks and chassis as defined in the detail standards of IEC 60917 and IEC 60297 for indoor and outdoor applications.
Standard replaced by (1)
IEC 61587-1:2007
IEC 61587-1:2007
March 2007
International standard Cancelled
Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 - Part 1: Climatic, mechanical tests and safety aspects for cabinets, racks, subracks and chassis

Specifies mechanical tests, climatic tests and safety aspects for cabinets, racks, subracks and chassis as defined in the standards of the IEC 60917 series and the IEC 60297 series for indoor applications. Ensures physical integrity and environmental performance in cabinets, racks, subracks and chassis, taking into account the need for different levels of performance in different applications. Gives the user a level of confidence in the selection of performance levels to meet as close as possible the individual application requirements. Changes with respect to the previous edition include an extension of performance levels.

Need to identify, monitor and decipher standards?