IEC 61747-5:1998
IEC 61747-5:1998

IEC 61747-5:1998

June 1998
International standard Cancelled

Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods

Lists test methods applicable to liquid crystal display devices. Takes into account, wherever possible, the environmental test methods outlined in IEC 60068.Also includes visual inspection for both liquid crystal display cells and modules.Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of liquid crystal display devices.

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Main informations

Collections

International IEC standards

Publication date

June 1998

Number of pages

73 p.

Reference

IEC 61747-5:1998

ICS Codes

31.120   Electronic display devices

Print number

1 - juin 2005
Sumary
Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods

Lists test methods applicable to liquid crystal display devices. Takes into account, wherever possible, the environmental test methods outlined in IEC 60068. Also includes visual inspection for both liquid crystal display cells and modules. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of liquid crystal display devices.
Replaced standards (3)
IEC 60747-5:1992/AMD1:1994
IEC 60747-5:1992/AMD1:1994
November 1994
International standard Cancelled
Amendment 1 - Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices

IEC 60747-5:1992/AMD2:1995
IEC 60747-5:1992/AMD2:1995
April 1995
International standard Cancelled
Amendment 2 - Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices

IEC 60747-5:1992
IEC 60747-5:1992
April 1992
International standard Cancelled
Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices

Provides terminology, letter symbols, essential ratings and characteristics as well as measuring methods for semiconductor photo-emitters, photo-electric detectors, photo-sensitive devices and semiconductor devices utilizing optical radiation for internal operation.

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