IEC 62153-4-3:2006
IEC 62153-4-3:2006

IEC 62153-4-3:2006

March 2006
International standard Cancelled

Metallic communication cable test methods - Part 4-3: Electromagnetic compatibility (EMC) - Surface transfer impedance - Triaxial method

determines the screening effectiveness of a shielded cable by applying a well-defined current and voltage to the screen of the cable and measuring the induced voltage in order to determine the surface transfer impedance. This test measures only the magnetic component of the transfer impedance.

Main informations

Collections

International IEC standards

Publication date

March 2006

Number of pages

57 p.

Reference

IEC 62153-4-3:2006

ICS Codes

33.100.10   Emission
33.120.10   Coaxial cables. Waveguides

Print number

1 - mai 2006
Sumary
Metallic communication cable test methods - Part 4-3: Electromagnetic compatibility (EMC) - Surface transfer impedance - Triaxial method

determines the screening effectiveness of a shielded cable by applying a well-defined current and voltage to the screen of the cable and measuring the induced voltage in order to determine the surface transfer impedance. This test measures only the magnetic component of the transfer impedance.
Standard replaced by (1)
IEC 62153-4-3:2013
IEC 62153-4-3:2013
October 2013
International standard Current
Metallic communication cable test methods - Part 4-3: Electromagnetic compatibility (EMC) - Surface transfer impedance - Triaxial method

IEC 62153-4-3:2013(E) determines the screening effectiveness of a cable shield by applying a well-defined current and voltage to the screen of the cable and measuring the induced voltage in order to determine the surface transfer impedance. This test measures only the magnetic component of the transfer impedance. This second edition cancels and replaces the first edition published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - now three different test configurations are described; - formulas to calculate the maximum frequency up to which the different test configurations can be used are included; - the effect of ground loops is described.

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