IEC 62228-2:2016

November 2016

International standard Current

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers:- the emission of RF disturbances,- the immunity against RF disturbances,- the immunity against impulses and- the immunity against electrostatic discharges (ESD).

Main informations

Collections

International IEC standards

Publication date

November 2016

Number of pages

85 p.

Reference

IEC 62228-2:2016

ICS Codes

31.200 Integrated circuits. Microelectronics

Print number

Sumary

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers:
- the emission of RF disturbances,
- the immunity against RF disturbances,
- the immunity against impulses and
- the immunity against electrostatic discharges (ESD).

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