IEC 62396-2:2012

IEC 62396-2:2012

September 2012
International standard Cancelled

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC 62396-2:2012 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process may be applied by other industrial sectors. This first edition includes the following significant technical changes with respect to the technical specification IEC/TS 62396-2:- additional information on heavy ion data, neutron and proton data and thermal neutron data;- updates with regard to neutron sources: additional radiation simulators;- addition of the Anita spallation neutron source;- additional information on whole system and equipment testing;- comparison between accelerator based neutron sources.

Main informations

Collections

International IEC standards

Publication date

September 2012

Number of pages

38 p.

Reference

IEC 62396-2:2012

ICS Codes

49.060   Aerospace electric equipment and systems
31.020   Electronic components in general
03.100.50   Production. Production management

Print number

1 - 05/10/2012
Sumary
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC 62396-2:2012 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process may be applied by other industrial sectors. This first edition includes the following significant technical changes with respect to the technical specification IEC/TS 62396-2:
- additional information on heavy ion data, neutron and proton data and thermal neutron data;
- updates with regard to neutron sources: additional radiation simulators;
- addition of the Anita spallation neutron source;
- additional information on whole system and equipment testing;
- comparison between accelerator based neutron sources.
Replaced standards (1)
IEC TS 62396-2:2008
August 2008
Technical specification Cancelled
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Standard replaced by (1)
IEC 62396-2:2017
December 2017
International standard Current
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC 62396-2:2017(E) aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth’s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process can be applied by other industrial sectors.

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