IEC 62396-5:2014
Collections
International IEC standards
Publication date
August 2014
Number of pages
21 p.
Reference
IEC 62396-5:2014
Print number
1
IEC 62396-5:2014
August 2014
International standard
Current
Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
IEC 62396-5:2014(E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. IEC 62396-5 addresses two main items:- a detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners, and- an enhanced compilation of the thermal neutron SEU cross-section in currently available SRAM devices (more than 20 different devices). The net result of the reviews of these two different sets of data will be two ratios that are considered to be very important for leading to the ultimate objective of determining how large a threat is. This new edition includes the following technical changes with respect to the previous technical specification: document upgraded to an IEC international standard, change to title, updated references and bibliography, consideration of smaller geometries, addition of recent data on neutron cross-sections, etc.
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Sumary
Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
IEC 62396-5:2014(E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. IEC 62396-5 addresses two main items:
- a detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners, and
- an enhanced compilation of the thermal neutron SEU cross-section in currently available SRAM devices (more than 20 different devices). The net result of the reviews of these two different sets of data will be two ratios that are considered to be very important for leading to the ultimate objective of determining how large a threat is. This new edition includes the following technical changes with respect to the previous technical specification: document upgraded to an IEC international standard, change to title, updated references and bibliography, consideration of smaller geometries, addition of recent data on neutron cross-sections, etc.
IEC 62396-5:2014(E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. IEC 62396-5 addresses two main items:
- a detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners, and
- an enhanced compilation of the thermal neutron SEU cross-section in currently available SRAM devices (more than 20 different devices). The net result of the reviews of these two different sets of data will be two ratios that are considered to be very important for leading to the ultimate objective of determining how large a threat is. This new edition includes the following technical changes with respect to the previous technical specification: document upgraded to an IEC international standard, change to title, updated references and bibliography, consideration of smaller geometries, addition of recent data on neutron cross-sections, etc.
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Replaced standards
(1)
IEC TS 62396-5:2008
August 2008
Technical specification
Cancelled
Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems
IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).
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