IEC PAS 62180:2000

August 2000

Publicly available specification Cancelled

Electrostatic discharge (ESD) sensitivity testing machine model (MM)

Establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined machine Model (MM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable MM ESD test results so that accurate classifications can be performed.

Main informations

Collections

International IEC standards

Publication date

August 2000

Number of pages

12 p.

Reference

IEC PAS 62180:2000

Print number

1 - 17/10/2000

Sumary

Electrostatic discharge (ESD) sensitivity testing machine model (MM)

Establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined machine Model (MM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable MM ESD test results so that accurate classifications can be performed.

Standard replaced by (1)

IEC 60749-27:2003

October 2003

International standard Cancelled

Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

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