IEC PAS 62276:2001

IEC PAS 62276:2001

August 2001
Publicly available specification Cancelled

Single crystal wafers applied for surface acoustic wave device - Specification and measuring method

Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators. Lays down specifications and measuring methods.

See more
Main informations

Collections

International IEC standards

Publication date

August 2001

Number of pages

33 p.

Reference

IEC PAS 62276:2001

Print number

1
Sumary
Single crystal wafers applied for surface acoustic wave device - Specification and measuring method

Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators. Lays down specifications and measuring methods.
Standard replaced by (1)
IEC 62276:2005
May 2005
International standard Cancelled
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.

Need to identify, monitor and decipher standards?

COBAZ is the simple and effective solution to meet the normative needs related to your activity, in France and abroad.

Available by subscription, CObaz is THE modular solution to compose according to your needs today and tomorrow. Quickly discover CObaz!

Request your free, no-obligation live demo

I discover COBAZ