IEC PAS 62396-2:2007

IEC PAS 62396-2:2007

September 2007
Publicly available specification Cancelled

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Main informations

Collections

International IEC standards

Publication date

September 2007

Number of pages

23 p.

Reference

IEC PAS 62396-2:2007

Print number

1
Sumary
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
Standard replaced by (2)
IEC 62396-2:2017
December 2017
International standard Current
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC/TS 62396-2:2008
August 2008
Technical specification Cancelled
Process management for avionics - Atmospheric radiation effects - Part 2 : guidelines for single event effects testing for avionics systems

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