IEC TR 62878-2-2:2015
IEC TR 62878-2-2:2015

IEC TR 62878-2-2:2015

December 2015
Technical report Current

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

Main informations

Collections

International IEC standards

Publication date

December 2015

Number of pages

29 p.

Reference

IEC TR 62878-2-2:2015
Sumary
Device embedded substrate - Part 2-2: Guidelines - Electrical testing

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
Need to identify, monitor and decipher standards?