IEC TR 62878-2-2:2015
Collections
International IEC standards
Publication date
December 2015
Number of pages
29 p.
Reference
IEC TR 62878-2-2:2015
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
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