IEC TR 63133:2017
Collections
International IEC standards
Publication date
October 2017
Number of pages
17 p.
Reference
IEC TR 63133:2017
Print number
1
IEC TR 63133:2017
October 2017
Technical report
Current
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
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Sumary
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
See more
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