IEC TS 62564-1:2011
IEC TS 62564-1:2011

IEC TS 62564-1:2011

August 2011
Technical specification Cancelled

Process management for avionics - Aerospace qualified electronic components (AQEC) - Part 1: Integrated circuits and discrete semiconductors

IEC/TS 62564-1:2011(E) defines the minimum requirements for integrated circuits and semiconductors which are to be designated an "Aerospace Qualified Electronic Component (AQEC)". The main change of this new edition consists of adding discrete semiconductors.

Main informations

Collections

International IEC standards

Publication date

August 2011

Number of pages

19 p.

Reference

IEC TS 62564-1:2011

Print number

2 - septembre 2011
Sumary
Process management for avionics - Aerospace qualified electronic components (AQEC) - Part 1: Integrated circuits and discrete semiconductors

IEC/TS 62564-1:2011(E) defines the minimum requirements for integrated circuits and semiconductors which are to be designated an "Aerospace Qualified Electronic Component (AQEC)". The main change of this new edition consists of adding discrete semiconductors.
Replaced standards (1)
IEC TS 62564-1:2009
Technical specification Cancelled
Aerospace qualified electronic component (AQEC) - Part 1: Microcircuits

IEC/TS 62564-1:2009(E) defines the minimum requirements for integrated circuits and semiconductors which are to be designated an "Aerospace qualified electronic component (AQEC)".

Standard replaced by (1)
IEC TS 62564-1:2016
Technical specification Current
Process management for avionics - Aerospace qualified electronic components (AQEC) - Part 1: Integrated circuits and discrete semiconductors

IEC TS 62564-1:2016(E) defines the minimum requirements for integrated circuits and semiconductors which are designated as an "aerospace qualified electronic component (AQEC)". This new edition includes the following significant technical changes with respect to the previous edition: - refers to the latest editions of IEC TS 62239-1 and IEC TS 62686-1, and of other publications; - adds information regarding components' life expectancy.

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