This document specifies the design, metrological characteristics and nominal characteristics of contact stylus instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.
This document specifies the design, metrological characteristics and nominal characteristics of contact stylus instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.
Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
ISO 25178-601:2010 defines the metrological characteristics of contact (stylus) areal surface texture measuring instruments.
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