ISO/TS 10798:2011
ISO/TS 10798:2011

ISO/TS 10798:2011

July 2011
Technical specification Current

Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

ISO/TS 10798:2011 establishes methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.The methods described in ISO/TS 10798:2011 for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).

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Main informations

Collections

International ISO standards

Publication date

July 2011

Number of pages

26 p.

Reference

ISO/TS 10798:2011

ICS Codes

07.120   Nanotechnologies

Print number

1 - juillet 2011
Sumary
Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

ISO/TS 10798:2011 establishes methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.

The methods described in ISO/TS 10798:2011 for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).

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