JIS H 0611

February 1994

Standard Current

Methods of measurement of thickness, thickness variation and bow for silicon wafer / Note: Approved 2020-10-20 JIS, 2015-10-20 JIS, 2010-10-01 JIS, 2006-01-20 JIS, 2001-09-20 JIS

Main informations

JIS japanese standards

February 1994

6 p.

JIS H 0611

29.045 Semiconducting materials

77.120.99 Other non-ferrous metals and their alloys

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