NF EN 60749-1
NF EN 60749-1

NF EN 60749-1

June 2003
Standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 1 : general

Le présent document est applicable aux dispositifs à semiconducteurs (dispositifs discrets et circuits intégrés) et établit des dispositions communes à toutes les autres parties de la série.

Main informations

Collections

National standards and national normative documents

Publication date

June 2003

Number of pages

10 p.

Reference

NF EN 60749-1

ICS Codes

31.080.01   Semiconductor devices in general

International kinship

European kinship

EN 60749-1:2003
Sumary
Semiconductor devices - Mechanical and climatic test methods - Part 1 : general

Le présent document est applicable aux dispositifs à semiconducteurs (dispositifs discrets et circuits intégrés) et établit des dispositions communes à toutes les autres parties de la série.
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