NF EN 60749-28

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

Le présent document établit une procédure pour les essais, l'évaluation et la classification des dispositifs et des microcircuits en fonction de leur susceptibilité (sensibilité) aux dommages ou de leur dégradation à la suite de leur exposition à des décharges électrostatiques (DES) sur un modèle défini du composant chargé (CDM) par induction.

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