NF EN 60749-31

NF EN 60749-31

November 2003
Standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced)

Le présent document est applicable aux dispositifs à semiconducteurs (dispositifs discrets et circuits intégrés).

See more
View the extract
Main informations

Collections

National standards and national normative documents

Publication date

November 2003

Number of pages

12 p.

Reference

NF EN 60749-31

ICS Codes

31.080.01   Semiconductor devices in general

Classification index

C96-022-31

Print number

1

International kinship

IEC 60749-31:2002

European kinship

EN 60749-31:2003
Sumary
Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced)

Le présent document est applicable aux dispositifs à semiconducteurs (dispositifs discrets et circuits intégrés).
Need to identify, monitor and decipher standards?

COBAZ is the simple and effective solution to meet the normative needs related to your activity, in France and abroad.

Available by subscription, CObaz is THE modular solution to compose according to your needs today and tomorrow. Quickly discover CObaz!

Request your free, no-obligation live demo

I discover COBAZ