NF EN 60749-31

NF EN 60749-31

November 2003
Standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced)

Le présent document est applicable aux dispositifs à semiconducteurs (dispositifs discrets et circuits intégrés).

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Main informations

Collections

National standards and national normative documents

Publication date

November 2003

Number of pages

12 p.

Reference

NF EN 60749-31

ICS Codes

31.080.01   Semiconductor devices in general

Classification index

C96-022-31

Print number

1

International kinship

IEC 60749-31:2002

European kinship

EN 60749-31:2003
Sumary
Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced)

Le présent document est applicable aux dispositifs à semiconducteurs (dispositifs discrets et circuits intégrés).
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