NF EN 60749-7

NF EN 60749-7

February 2012
Standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 7 : internal moisture content measurement and the analysis of other residual gases

Le présent document spécifie les essais et les mesures de la teneur en vapeur d'eau et en autres gaz de l'atmosphère à l'intérieur d'un dispositif métallique ou céramique scellé hermétiquement.

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Main informations

Collections

National standards and national normative documents

Publication date

February 2012

Number of pages

13 p.

Reference

NF EN 60749-7

ICS Codes

31.080.01   Semiconductor devices in general

Classification index

C96-022-7

Print number

1 - 24/02/2012

International kinship

European kinship

EN 60749-7:2011
Sumary
Semiconductor devices - Mechanical and climatic test methods - Part 7 : internal moisture content measurement and the analysis of other residual gases

Le présent document spécifie les essais et les mesures de la teneur en vapeur d'eau et en autres gaz de l'atmosphère à l'intérieur d'un dispositif métallique ou céramique scellé hermétiquement.
Replaced standards (1)
NF EN 60749-7
December 2002
Standard Cancelled
Semiconductor devices - Mechanical and climatic test methods - Part 7 : internal moisture content measurement and the analysis of other residual gases

Le présent document décrit l'essai de mesure de la teneur en humidité interne et analyse des autres gaz résiduels.

Table of contents
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  • AVANT-PROPOS
    2
  • 1 Domaine d'application
    4
  • 2 Références normatives
    4
  • 3 Termes et définitions
    4
  • 4 Appareillage d'essai
    4
  • 4.1 Méthode du spectromètre de masse
    4
  • 4.2 Spectromètre de masse
    4
  • 4.3 Enceinte de perçage
    6
  • 4.4 Disposition de percement
    7
  • 4.5 Dispositif sensible à la pression
    7
  • 5 Procédure
    7
  • 6 Critères de défaillance
    8
  • 7 Mise en oeuvre
    9
  • 8 Résumé
    9
  • Bibliographie
    10
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