NF EN IEC 60749-5

NF EN IEC 60749-5

January 2024
Standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test

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Main informations

Collections

National standards and national normative documents

Publication date

January 2024

Number of pages

13 p.

Reference

NF EN IEC 60749-5

ICS Codes

31.080.01   Semiconductor devices in general

Classification index

C96-022-5

Print number

1

International kinship

IEC 60749-5:2023

European kinship

EN IEC 60749-5:2024
Table of contents
  • 1 Domaine d'application
  • 2 Références normatives
  • 3 Termes et définitions
  • 4 Généralités
  • 5 Équipement
  • 6 Conditions d'essai
  • 7 Procédures
  • 8 Critères de défaillance
  • 9 Sécurité
  • 10 Résumé
  • ZA Références normatives à d'autres publications internationales avec les publications européennes correspondantes
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