NF EN ISO 13696

NF EN ISO 13696

September 2003
Standard Cancelled

Optics and optical instruments - Test methods for radiation scattered by optical components

ISO 13696:2002 specifies procedures for the determination of the total scattering by coated and uncoated optical surfaces. Procedures are given for measuring the contributions of the forward scattering and backward scattering to the total scattering of an optical component.ISO 13696:2002 applies to coated and uncoated optical components with optical surfaces that have a radius of curvature of more than 10 m. The wavelength range includes the ultraviolet, the visible and the infrared spectral regions.

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National standards and national normative documents

Publication date

September 2003

Number of pages

38 p.

Reference

NF EN ISO 13696

ICS Codes

37.020   Optical equipment
31.260   Optoelectronics. Laser equipment

Classification index

S10-115

Print number

1 - 19/11/2003

International kinship

ISO 13696:2002

European kinship

EN ISO 13696:2002
Sumary
Optics and optical instruments - Test methods for radiation scattered by optical components

ISO 13696:2002 specifies procedures for the determination of the total scattering by coated and uncoated optical surfaces. Procedures are given for measuring the contributions of the forward scattering and backward scattering to the total scattering of an optical component.

ISO 13696:2002 applies to coated and uncoated optical components with optical surfaces that have a radius of curvature of more than 10 m. The wavelength range includes the ultraviolet, the visible and the infrared spectral regions.

Standard replaced by (1)
NF EN ISO 13696
June 2022
Standard Current
Optics and photonics - Test method for total scattering by optical components

This document specifies procedures for the determination of the total scattering by coated and uncoated optical surfaces. Procedures are given for measuring the contributions of the forward scattering or backward scattering to the total scattering of an optical component. This document applies to coated and uncoated optical components with optical surfaces that have a radius of curvature of more than 10 m. Measurement wavelengths covered by this document range from the ultraviolet above 250 nm to the infrared spectral region below 15 µm. For measurements in the deep ultraviolet between 190 nm to 250 nm, specific methods are considered and are described. Generally, optical scattering is considered as neglectable for wavelengths above 15 µm.

Table of contents
  • Avant-propos
    iv
  • Introduction
    v
  • 1 Domaine d'application
    1
  • 2 Références normatives
    1
  • 3 Termes définitions et symboles
    1
  • 3.1 Termes et définitions
    1
  • 3.2 Symboles et unités de mesure
    3
  • 4 Méthode d'essai
    3
  • 4.1 Principe
    3
  • 4.2 Dispositif de mesure et équipement d'essai
    3
  • 4.3 Dispositif à sensibilité élevée
    6
  • 4.4 Préparation des éprouvettes
    l
  • 5 Mode opératoire
    7
  • 5.1 Généralités
    7
  • 5.2 Procédure d'alignement
    8
  • 5.3 Méthode de mesure
    8
  • 6 Évaluation
    9
  • 6.1 Détermination de la valeur de diffusion totale
    9
  • 6.2 Bilan des erreurs
    11
  • 7 Rapport d'essai
    12
  • Annexe A (informative) Montage avec une sphère de Coblenta
    14
  • Annexe B (informative) Modèle de rapport d'essai
    16
  • Annexe C (informative)
    Exemple d'évaluation statistique 20
  • Annexe D (informative) Exemple de sélection de l'espacement
    25
  • Bibliographie
    28
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