NF EN ISO 3882

NF EN ISO 3882

August 2003
Standard Current

Metallic and other inorganic coatings - Review of methods of measurement of thickness

ISO 3882:2003 reviews methods for measuring the thickness of metallic and other inorganic coatings on both metallic and non-metallic substrates. It is limited to tests already specified, or to be specified, in International Standards, and excludes certain tests that are used for special applications.

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Main informations

Collections

National standards and national normative documents

Publication date

August 2003

Number of pages

18 p.

Reference

NF EN ISO 3882

ICS Codes

25.220.20   Surface treatment
25.220.40   Metallic coatings

Classification index

A91-109

Print number

1 - 28/10/2003

International kinship

ISO 3882:2003

European kinship

EN ISO 3882:2003
Sumary
Metallic and other inorganic coatings - Review of methods of measurement of thickness

ISO 3882:2003 reviews methods for measuring the thickness of metallic and other inorganic coatings on both metallic and non-metallic substrates. It is limited to tests already specified, or to be specified, in International Standards, and excludes certain tests that are used for special applications.

Replaced standards (1)
NF EN ISO 3882
April 1995
Standard Cancelled
Metallic and other non-organic coatings. Review of methods of measurement of thickness.

Table of contents
  • Avant-propos
    iv
  • Introduction
    v
  • Domaine d'application
  • 2 Références normatives
  • 3 Termes et définitions
    2
  • 4 éthodes non destructives
    2
  • 4.1 MMéthode par mesurage au microscope à coupe optique, ISO 2128
    2
  • 4.2 Méthodes magnétiques, ISO 2178 et ISO 2361
    3
  • 4.3 Méthode des courants de Foucault, ISO 2360
    3
  • 4.4 Méthodes par spectrométrie de rayons X, ISO 3497
    3
  • 4.5 Méthode par rétrodiffusion des rayons bêta, ISO 3543
    4
  • 5 Méthodes destructives
    4
  • 5.1 Méthode par coupe micrographique (optique), ISO 1463
    4
  • 5.2 Méthode basée sur le principe de Fizeau d'interférométrie à faisceaux multiples, ISO 3868
    4
  • 5.3 Méthode profilométrique (par palpeur), ISO 4518
    5
  • 5.4 Méthode au microscope électronique à balayage, ISO 9220
    5
  • 5.5 Méthodes par dissolution
    5
  • Bibliographie
    10
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