ISO 10110-7:2008 specifies the indication of the level of acceptability of surface imperfections within the effective aperture of individual optical elements and optical assemblies. These include localized surface imperfections, edge chips and long scratches.ISO 10110-7:2008 applies to transmitting and reflecting surfaces of finished optical elements, whether or not they are coated, and to optical assemblies. It recognizes that permissible imperfections may be specified according to the area affected by imperfections on components or in optical assemblies.
ISO 10110-7:2008 specifies the indication of the level of acceptability of surface imperfections within the effective aperture of individual optical elements and optical assemblies. These include localized surface imperfections, edge chips and long scratches.
ISO 10110-7:2008 applies to transmitting and reflecting surfaces of finished optical elements, whether or not they are coated, and to optical assemblies. It recognizes that permissible imperfections may be specified according to the area affected by imperfections on components or in optical assemblies.
ISO 10110 (all parts) specifies the presentation of design and functional requirements for single optical elements and for optical assemblies in technical drawings used for their manufacture and inspection. ISO 10110-7:2017 specifies the indication of the level of acceptability of surface imperfections within a test region on individual optical elements and optical assemblies. These include localized surface imperfections, edge chips and long scratches. The acceptance level for imperfections is specified, taking into account functional effects (affecting image formation or durability of the optical element), as well as cosmetic (appearance) effects. ISO 10110-7:2017 applies to transmitting and reflecting surfaces of finished optical elements, whether or not they are coated, and to optical assemblies. It allows permissible imperfections to be specified according to the area affected by imperfections, or alternatively by the visibility of imperfections, on components or in optical assemblies.
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