NF ISO 14997
Optics and photonics - Test methods for surface imperfections of optical elements
ISO 14997:2011 establishes the physical principles and practical means for the implementation of methods for measuring surface imperfections. This method evaluates the surface area obscured or affected by the imperfections.
ISO 14997:2011 establishes the physical principles and practical means for the implementation of methods for measuring surface imperfections. This method evaluates the surface area obscured or affected by the imperfections.
ISO 14997:2003 establishes the physical principles and practical means for the implementation of two methods, specified in ISO 10110-7, for measuring surface imperfections. These methods are: Method l, the surface area obscured or affected by the defects, and, Method ll, the visibility of the imperfections. Both methods are suitable for prototype, small scale or large scale production of a wide variety of optical components. Imperfection appearance or functional tolerances related to a particular component can be determined by agreement between supplier and customer.
ISO 14997:2017 specifies the physical principles and practical means for the implementation of methods for evaluating surface imperfections. For imperfections specified using the visibility method, two inspection methods are described. The first is visual evaluation of the surface without any comparison standard (IVV). The second is a visibility assessment of a surface imperfection when compared to an artefact of known brightness (ISV). For imperfections specified using the dimensional method, three methods are described. The first is visual evaluation of the surface without any comparison standard (IVD). The second is a dimensional assessment of a surface imperfection when compared to an artefact of known size (ISD). The third is the dimensional measurement of a surface imperfection using magnification and either a comparison artefact of known size or a reticle or ruler (IMD). Instruments exist that allow objective measurement of brightness (digital scatterometry) or size (digital microscopy). While these instruments can be used for evaluation of surface imperfections, they are beyond the scope of this document. ISO 14997:2017 applies to optical surfaces of components or assemblies such as doublets or triplets. ISO 14997:2017 can be applied to optical plastic components; however, attention is drawn to the fact that impact damage to plastic materials often looks very different from that on harder materials as it does not always result in the removal of material but instead can displace material, causing ripples in the surface. Consequently, visual comparisons of scratch and dig damage to plastic with those on glass or crystalline materials can give very different results.
- Avant-proposiv
- Introductionv
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1 Domaine d'application1
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2 Références normatives1
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3 Termes et définitions1
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4 Principes physiques2
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5 Mesurage de la zone obscurcie ou affectée par les défauts3
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5.1 Généralités3
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5.2 Exigences3
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5.3 Étalonnage4
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5.4 Mode opératoire4
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5.5 Rapport d'essai5
- Annexe A (informative) Contrôle des éléments6
- Annexe B (informative) Dimensions recommandées des artefacts sur un plateau de comparaison gradué7
- Annexe C (informative) Description de l'instrument de mesure des imperfections inférieures à 0,01 mm: microscope comparateur d'images8
- Annexe D (informative) Contrôle qualité des imperfections11
- Annexe E (normative) Valeurs préférentielles des références de classe et facteurs de subdivision13
- Bibliographie14
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