NF ISO 15932
Microbeam analysis - Analytical electron microscopy - Vocabulary
ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.
ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.
- Avant-proposiv
- Introductionv
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0 Domaine d'application1
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1 Termes abrégés1
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2 Définitions des termes utilisés dans les bases physiques de la MEA2
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3 Définitions de termes utilisés dans l'instrumentation de MEA6
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4 Définitions des termes utilisés dans la préparation de l'échantillon en MEA11
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5 Définitions des termes utilisés dans la formation et le traitement des images en MEA12
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6 Définitions des termes utilisés dans l'interprétation et l'analyse des images en MEA14
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7 Définitions des termes utilisés pour le mesurage et l'étalonnage du grandissement et de la résolution d'image MEA18
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8 Définitions des termes utilisés dans la diffraction des électrons en MEA19
- Bibliographie22
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