NF ISO 23830

NF ISO 23830

February 2009
Standard Current

Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

ISO 23830:2008 specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.

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Main informations

Collections

National standards and national normative documents

Publication date

February 2009

Number of pages

19 p.

Reference

NF ISO 23830

ICS Codes

71.040.40   Chemical analysis

Classification index

X21-064

Print number

1 - 03/02/2009

International kinship

ISO 23830:2008
Sumary
Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

ISO 23830:2008 specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.

Table of contents
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  • Avant-propos
    iv
  • Introduction
    v
  • 1 Domaine d'application
    1
  • 2 Symboles et termes abrégés
    1
  • 3 Aperçu de la méthode
    2
  • 4 Méthode permettant de confirmer la répétabilité et la constance de l'échelle des intensités
    4
  • 4.1 Obtention de l'échantillon de référence
    4
  • 4.2 Préparation du montage de l'échantillon
    4
  • 4.3 Montage de l'échantillon
    4
  • 4.4 Choix des réglages du spectromètre pour lesquels la stabilité de l'intensité doit être déterminée
    4
  • 4.5 Fonctionnement de l'instrument
    4
  • 4.6 Mesurages de l'intensité et sa répétabilité
    6
  • 4.7 Calcul de la répétabilité des intensités
    7
  • 4.8 Mode opératoire de détermination régulière de la constance de l'échelle des intensités relatives
    9
  • 4.9 Étalonnage suivant
    11
  • Annexe A (informative) Exemples de conditions de fonctionnement appropriées pour la SIMS statique
    12
  • Bibliographie
    13
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