XP CEN/TS 17629

Nanotechnologies - Nano- and micro- scale scratch testing

Le présent document spécifie une méthode permettant de mesurer la résistance à la rayure et le comportement à la rupture des matériaux avancés et des revêtements, au moyen d'expériences de rayure aux échelles nano- et micro-métriques. La méthode fournit des données portant à la fois sur les dommages physiques occasionnés aux éprouvettes et sur le frottement généré entre la sonde et l'éprouvette en une seule ou plusieurs passes. Les forces à appliquer pour ces essais sont comprises entre 1 micron N et 2 N.

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