XP ISO/TS 11888

XP ISO/TS 11888

January 2013
Standard Cancelled

Nanotechnologies - Characterization of multiwall carbon nanotubes - Mesoscopic shape factors

ISO/TS 11888:2011 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy, transmission electron microscopy, viscometry, and light scattering analysis.ISO/TS 11888:2011 also includes additional terms needed to define the characterization of scattered bending persistence length (SBPL). Two approximation methods are given for the evaluation of SBPL. Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.

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Main informations

Collections

National standards and national normative documents

Publication date

January 2013

Number of pages

26 p.

Reference

XP ISO/TS 11888

ICS Codes

07.120   Nanotechnologies

Classification index

T16-205

Print number

1 - 18/02/2013

International kinship

ISO/TS 11888:2011
Sumary
Nanotechnologies - Characterization of multiwall carbon nanotubes - Mesoscopic shape factors

ISO/TS 11888:2011 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy, transmission electron microscopy, viscometry, and light scattering analysis.

ISO/TS 11888:2011 also includes additional terms needed to define the characterization of scattered bending persistence length (SBPL). Two approximation methods are given for the evaluation of SBPL.

Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.

Standard replaced by (1)
XP ISO/TS 11888
August 2017
Standard Current
Nanotechnologies - Characterization of multiwall carbon nanotubes - Mesoscopic shape factors

ISO/TS 11888:2017 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy (SEM), transmission electron microscopy (TEM), viscometry, and light scattering analysis. ISO/TS 11888:2017 also includes additional terms needed to define the characterization of static bending persistence length (SBPL). Measurement methods are given for the evaluation of SBPL, which generally varies from several tens of nanometres to several hundred micrometres. Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.

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