XP ISO/TS 21749
XP ISO/TS 21749

XP ISO/TS 21749

October 2005
Standard Current

Measurement uncertainty for metrological applications — Repeated measurements and nested experiments

Main informations

Collections

National standards and national normative documents

Publication date

October 2005

Number of pages

47 p.

Reference

XP ISO/TS 21749

ICS Codes

17.020   Metrology and measurement in general

International kinship

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