IEC 60747-11:1985

January 1985

International standard Cancelled

Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

Applies to discrete semiconductor devices, excluding optoelectronicdevices. Should be read together with the generic specification towhich it refers: it gives details of the Quality AssessmentProcedures, the inspection requirements, screening sequences,sampling requirements, test and measurement procedures required forthe assessment of semiconductor devices.

Main informations

Collections

International IEC standards

Publication date

January 1985

Number of pages

35 p.

Reference

IEC 60747-11:1985

Print number

1 - 13/06/2005

Sumary

Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.

Need to identify, monitor and decipher standards?

COBAZ is the simple and effective solution to meet the normative needs related to your activity, in France and abroad.

Available by subscription, CObaz is THE modular solution to compose according to your needs today and tomorrow. Quickly discover CObaz!

Request your free, no-obligation live demo

I discover COBAZ