IEC 60747-11:1985
IEC 60747-11:1985

IEC 60747-11:1985

January 1985
International standard Cancelled

Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

Applies to discrete semiconductor devices, excluding optoelectronicdevices. Should be read together with the generic specification towhich it refers: it gives details of the Quality AssessmentProcedures, the inspection requirements, screening sequences,sampling requirements, test and measurement procedures required forthe assessment of semiconductor devices.

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Main informations

Collections

International IEC standards

Publication date

January 1985

Number of pages

35 p.

Reference

IEC 60747-11:1985

Print number

1 - juin 2005
Sumary
Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.
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