IEC 60748-22:1997

IEC 60748-22:1997

April 1997
International standard Current

Semiconductor devices - Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

Applies to film and hybrid film integrated circuits (F and HICs),manufactured as catalogue or as custom-built circuits whosequality is assessed on the basis of the capability approvalprocedure. Presents preferred values for ratings andcharacteristics, selects from the generic specificationthe appropriate tests and measuring methods and gives generalperformance requirements to be used in detailspecifications for film and hybrid film integrated circuits.

Main informations

Collections

International IEC standards

Publication date

April 1997

Number of pages

121 p.

Reference

IEC 60748-22:1997
Sumary
Semiconductor devices - Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

Applies to film and hybrid film integrated circuits (F and HICs), manufactured as catalogue or as custom-built circuits whose quality is assessed on the basis of the capability approval procedure. Presents preferred values for ratings and characteristics, selects from the generic specification the appropriate tests and measuring methods and gives general performance requirements to be used in detail specifications for film and hybrid film integrated circuits.
Replaced standards (1)
IEC 60748-22:1992
April 1992
International standard Cancelled
Semiconductor devices. Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures.

Applies to film integrated circuits and hybrid film integrated circuits (F and HICs), manufactured as catalogue or as custom-built circuits whose quality is assessed on the basis of the capability approval procedure. Presents preferred values for ratings and characteristics, selects from the generic specification the appropriate tests and measuring methods and gives general performance requirements to be used in detail specifications for film integrated circuits and hybrid film integrated circuits.

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