IEC 61164:2004
IEC 61164:2004

IEC 61164:2004

March 2004
International standard Current

Reliability growth - Statistical test and estimation methods

IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:- addition of two statistical models for reliability growth planning and tracking in the product design phase;- statistical methods for the reliability growth programme in the design phase of IEC 61014;- addition of the discrete reliability growth model for the test phase;- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;- addition of real lif examples for most of the statistical models;- numerical correction of tables in the reliability growth test example.This publication is to be read in conjunction with IEC 61014:2003.

Main informations

Collections

International IEC standards

Publication date

March 2004

Number of pages

55 p.

Reference

IEC 61164:2004

ICS Codes

03.120.30   Application of statistical methods
03.120.01   Quality in general
Sumary
Reliability growth - Statistical test and estimation methods

IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example.

This publication is to be read in conjunction with IEC 61014:2003.
Replaced standards (1)
IEC 61164:1995
IEC 61164:1995
June 1995
International standard Cancelled
Reliability growth - Statistical test and estimation methods

This standard gives models and numerical methods for reliability growth assessments based on failure data from a single system which were generated in a reliability improvement programme.

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