IEC 60444-8:2003
Collections
International IEC standards
Publication date
July 2003
Number of pages
21 p.
Reference
IEC 60444-8:2003
Print number
1
IEC 60444-8:2003
July 2003
International standard
Cancelled
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.
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Sumary
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.
Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.
See more
Voir moins
Standard replaced by
(1)
IEC 60444-8:2016
December 2016
International standard
Current
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
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