IEC PAS 62277:2001

IEC PAS 62277:2001

August 2001
Publicly available specification Cancelled

Test-fixture of surface mounting quartz crystal units

Describes the test-fixture that allows the accurate measurement of resonance frequency, resonance resistance, and electrical-equivalent-circuit constants of a leadless surface mounting quartz crystal using the zero phase technique as specified in IEC 60444.

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International IEC standards

Publication date

August 2001

Number of pages

11 p.

Reference

IEC PAS 62277:2001

Print number

1
Sumary
Test-fixture of surface mounting quartz crystal units

Describes the test-fixture that allows the accurate measurement of resonance frequency, resonance resistance, and electrical-equivalent-circuit constants of a leadless surface mounting quartz crystal using the zero phase technique as specified in IEC 60444.
Standard replaced by (1)
IEC 60444-8:2003
July 2003
International standard Cancelled
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.

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