IEC 60749-26:2003

October 2003

International standard Cancelled

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed.The testing shall be selected from this test method or the machine model test method (see IEC 60749-27).

Main informations

Collections

International IEC standards

Publication date

October 2003

Number of pages

27 p.

Reference

IEC 60749-26:2003

Print number

1 - 13/06/2005

Sumary

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the machine model test method (see IEC 60749-27).

Standard replaced by (1)

IEC 60749-26:2006

July 2006

International standard Cancelled

Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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