IEC 60891:2009

Gives procedures that should be followed for temperature and irradiance corrections to the measured I-V characteristics of only crystalline silicon photovoltaic devices.

IEC 60891:2021 defines procedures to be followed for temperature and irradiance corrections to the measured I-V (current-voltage) characteristics (also known as I-V curves) of photovoltaic (PV) devices. It also defines the procedures used to determine factors relevant to these corrections. Requirements for I-V measurement of PV devices are laid down in IEC 60904-1 and its relevant subparts. This third edition cancels and replaces the second edition published in 2009. This edition includes the following significant technical changes with respect to the previous edition: - adds guidance on which correction procedure shall be used depending on application; - introduces translation procedure 4 applicable to c-Si technologies with unknown temperature coefficients; - introduces various clarifications in existing procedures to improve measurement accuracy and reduce measurement uncertainty; - adds an informative annex for supplementary methods that can be used for series resistance determination. The content of the corrigendum 1 (2024-10) has been included in this copy.