IEC 61280-2-2:1998
Fibre optic communication subsystem basic test procedures - Part 2-2: Test procedures for digital systems - Optical eye pattern, waveform, and extinction ratio
Describes a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
Describes a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
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