IEC 61280-2-2:2005
Collections
International IEC standards
Publication date
April 2005
Number of pages
51 p.
Reference
IEC 61280-2-2:2005
Print number
2
IEC 61280-2-2:2005
April 2005
International standard
Cancelled
Fibre optic communication subsystem test procedures - Part 2-2: Digital systems - Optical eye pattern, waveform and extinction ratio measurement
Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
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Sumary
Fibre optic communication subsystem test procedures - Part 2-2: Digital systems - Optical eye pattern, waveform and extinction ratio measurement
Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
See more
Voir moins
Replaced standards
(1)
IEC 61280-2-2:1998
December 1998
International standard
Cancelled
Fibre optic communication subsystem basic test procedures - Part 2-2: Test procedures for digital systems - Optical eye pattern, waveform, and extinction ratio
Describes a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
Standard replaced by
(1)
IEC 61280-2-2:2008
March 2008
International standard
Cancelled
Fibre optic communication subsystem test procedures - Part 2-2: Digital systems - Optical eye pattern, waveform and extinction ratio measurement
This part of IEC 61280 is to describe a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask. This edition includes the following significant technical changes with respect to the previous edition: - the necessity of DC coupling for extinction ratio measurement is clarified; - the definition of extinction ratio has been revised to better harmonize with ITU-T; and - the definition of OMA has been clarified.
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