IEC PAS 62161:2000

IEC PAS 62161:2000

August 2000
Publicly available specification Cancelled

Steady state temperature humidity bias life test

Aims at evaluating the reliability of nonhermetic packaged solid-state devices in humid environments. Employs conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

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Main informations

Collections

International IEC standards

Publication date

August 2000

Number of pages

6 p.

Reference

IEC PAS 62161:2000

Print number

1
Sumary
Steady state temperature humidity bias life test

Aims at evaluating the reliability of nonhermetic packaged solid-state devices in humid environments. Employs conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
Standard replaced by (1)
IEC 60749-5:2003
January 2003
International standard Cancelled
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

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