IEC 60749-5:2003
IEC 60749-5:2003

IEC 60749-5:2003

January 2003
International standard Cancelled

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

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Main informations

Collections

International IEC standards

Publication date

January 2003

Number of pages

13 p.

Reference

IEC 60749-5:2003

ICS Codes

31.080.01   Semiconductor devices in general

Print number

1 - juin 2005
Sumary
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Replaced standards (1)
IEC PAS 62161:2000
IEC PAS 62161:2000
August 2000
Publicly available specification Cancelled
Steady state temperature humidity bias life test

Aims at evaluating the reliability of nonhermetic packaged solid-state devices in humid environments. Employs conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Standard replaced by (1)
IEC 60749-5:2017
IEC 60749-5:2017
April 2017
International standard Cancelled
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) correction of an error in an equation; b) inclusion of notes for guidance; c) clarification of the applicability of test conditions.

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