IEC PAS 62178:2000
Collections
International IEC standards
Publication date
August 2000
Number of pages
6 p.
Reference
IEC PAS 62178:2000
Print number
1
IEC PAS 62178:2000
August 2000
Publicly available specification
Cancelled
Temperature cycling
This test is conducted to determine the resistance of a part to extremes of high- and low-temperatures and to the effect of alternate exposures to these extremes.
Main informations
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Sumary
Temperature cycling
This test is conducted to determine the resistance of a part to extremes of high- and low-temperatures and to the effect of alternate exposures to these extremes.
This test is conducted to determine the resistance of a part to extremes of high- and low-temperatures and to the effect of alternate exposures to these extremes.
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Voir moins
Standard replaced by
(1)
IEC 60749-25:2003
July 2003
International standard
Current
Semiconductor devices - Mechanical and climatic test methods - Part 25 : temperature cycling
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