NF EN 60749-10
NF EN 60749-10

NF EN 60749-10

December 2002
Standard Cancelled

Semiconductor devices - Mechanical and climatic test methods - Part 10 : mechanical shock

Le présent document décrit l'essai de chocs mécaniques appliqué aux semiconducteurs.

Main informations

Collections

National standards and national normative documents

Publication date

December 2002

Release date

juin 2025

Number of pages

7 p.

Reference

NF EN 60749-10

ICS Codes

31.080.01   Semiconductor devices in general

Classification index

C96-022-10

Print number

1

International kinship

IEC 60749-10:2002

European kinship

EN 60749-10:2002
Sumary
Semiconductor devices - Mechanical and climatic test methods - Part 10 : mechanical shock

Le présent document décrit l'essai de chocs mécaniques appliqué aux semiconducteurs.
Standard replaced by (1)
NF EN IEC 60749-10
NF EN IEC 60749-10
June 2022
Standard Current
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly

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