NF EN IEC 60749-10
NF EN IEC 60749-10

NF EN IEC 60749-10

June 2022
Standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly

Main informations

Collections

National standards and national normative documents

Publication date

June 2022

Number of pages

16 p.

Reference

NF EN IEC 60749-10

ICS Codes

31.080.01   Semiconductor devices in general

Print number

1

European kinship

EN IEC 60749-10:2022
Replaced standards (1)
NF EN 60749-10
NF EN 60749-10
December 2002
Standard Cancelled
Semiconductor devices - Mechanical and climatic test methods - Part 10 : mechanical shock

Le présent document décrit l'essai de chocs mécaniques appliqué aux semiconducteurs.

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